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46MIPS User’s Guide – Test patterns

Grid (Angle) test pattern

The last test pattern available in the MIPS unit is the Grid (Angle) test pattern. This is used to

create a reference grid in a dome or a cylinder.

Parameters to specify for this grid are ‘to’ and ‘from’ angles (in degrees) in horizontal and

vertical direction. The frequency of the reference points can also be speciﬁ ed, as seen in

Figure 9-34.

Figure 9-34. Grid (Angle) test pattern

Turning test patterns on and off

When using a test pattern it can be convenient to disable the warp calibration grid. Select

“Layers” in the Calibration Panel toolbar and disable Warp, Figure 9-35.

Figure 9-35. Disabling the warp grid

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Projectiondesign Action one mk III Guida Utente Pagina 46